Separation of surface and bulk components in MOS-C generation rate measurements : D. W. Small and R. F. Pierret. Solid-State Electronics19 (6), 505 (1976)

• Publisher: Elsevier Science
• Year: 1976
• Tongue: English
• Weight: 121 KB
• Volume: 15
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(76)90442-x