✦ LIBER ✦

Sensitization versus tolerance to haloperidol-induced catalepsy: Multiple determinants

✍ Scribed by Deborah E. Barnes; Bruce Robinson; John C. Csernansky; Elisabeth P. Bellows

Book ID: 113223705
Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 510 KB
Volume: 36
Category: Article
ISSN: 0091-3057
DOI: 10.1016/0091-3057(90)90094-x

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Haloperidol-induced tolerance to morphin

Haloperidol-induced tolerance to morphine catalepsy

✍ Cheryl Ezrin-Waters; Philip Seeman 📂 Article 📅 1977 🏛 Elsevier Science 🌐 English ⚖ 173 KB

Conditioned tolerance to haloperidol- an

Conditioned tolerance to haloperidol- and droperidol-induced catalepsy

✍ K. Nowak; S. Welsch-Kunze; K. Kuschinsky 📂 Article 📅 1988 🏛 Springer-Verlag 🌐 English ⚖ 736 KB

Conditional tolerance to haloperidol-ind

Conditional tolerance to haloperidol-induced catalepsy is not caused by striatal dopamine receptor supersensitivity

✍ Chris J. Graaf; Jakob Korf 📂 Article 📅 1986 🏛 Springer 🌐 English ⚖ 423 KB

The purpose of this study was to determine if non-pharmacological stimuli influence behavioural tolerance to haloperidol via striatal postsynaptic dopamine receptors. Rats received daily haloperidol and saline in two different environments for a period of 28 days. After this conditioning period half

Conditional tolerance to haloperidol-ind

Conditional tolerance to haloperidol-induced catalepsy: striatal dopamine receptor supersensitivity is a possible explanation

✍ Diane C. Hoffman; Richard J. Beninger 📂 Article 📅 1988 🏛 Springer 🌐 English ⚖ 140 KB

Sensitization versus tolerance to the do

Sensitization versus tolerance to the dopamine turnover-elevating effects of haloperidol: the effect of regular/intermittent dosing

✍ John G. Csernansky; Elisabeth P. Bellows; Deborah E. Barnes; Leon Lombrozo 📂 Article 📅 1990 🏛 Springer 🌐 English ⚖ 685 KB

[IEEE 22nd IEEE International Symposium

[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Sensitivity evaluation of TMR-hardened circuits to multiple SEUs induced by alpha particles in commercial SRAM-based FPGAs

✍ Manuzz, A.; Rech, P.; Gerardin, S.; Paccagnella, A.; Sterpone, L.; Violante, M. 📂 Article 📅 2007 🏛 IEEE 🌐 English ⚖ 380 KB