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Semiconductor Surface Roughness: Dependence on Sign and Magnitude of Bulk Strain

โœ Scribed by Xie, Y. H.; Gilmer, G. H.; Roland, C.; Silverman, P. J.; Buratto, S. K.; Cheng, J. Y.; Fitzgerald, E. A.; Kortan, A. R.; Schuppler, S.; Marcus, M. A.; Citrin, P. H.


Book ID
121449477
Publisher
The American Physical Society
Year
1994
Tongue
English
Weight
477 KB
Volume
73
Category
Article
ISSN
0031-9007

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