Semiconductor Surface Roughness: Dependence on Sign and Magnitude of Bulk Strain
โ Scribed by Xie, Y. H.; Gilmer, G. H.; Roland, C.; Silverman, P. J.; Buratto, S. K.; Cheng, J. Y.; Fitzgerald, E. A.; Kortan, A. R.; Schuppler, S.; Marcus, M. A.; Citrin, P. H.
- Book ID
- 121449477
- Publisher
- The American Physical Society
- Year
- 1994
- Tongue
- English
- Weight
- 477 KB
- Volume
- 73
- Category
- Article
- ISSN
- 0031-9007
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