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Dependence of surface screening in semiconductors on the short-range properties of the bulk dielectric function

✍ Scribed by M. Cinal; R. Del Sole; J. Krupski; W. Bardyszewski; G. Strinati

Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
231 KB
Volume
62
Category
Article
ISSN
0038-1098

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## Abstract The effect of changes in the bulk dielectric constant on the DNA torsional properties was evaluated from plasmid circularization reactions. In these reactions, pUC18 previously linearized by EcoRI digestion was recircularized with T4 DNA ligase. The bulk dielectric constant of the react