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Semiconductor Nanostructures

✍ Scribed by A. Di Carlo


Publisher
John Wiley and Sons
Year
2000
Tongue
English
Weight
370 KB
Volume
217
Category
Article
ISSN
0370-1972

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## Abstract For Abstract see ChemInform Abstract in Full Text.

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Several aspects of extending reflection difference spectroscopy (RDS) to sub-micrometer-, and possibly even nanometer-, resolution are discussed. Details of our recently developed mRDS technique, and an analysis of artifacts in non-ideal systems, are presented. We performed macroscopic and microscop