Semiconductor materials and devices characterization by noise measurements: J. Graffeuil and G. Blasquez Acta Electron. 25 (3), 261 (1983). In French

• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 92 KB
• Volume: 17
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(86)80031-3

✦ Synopsis

Electric noise study in semiconductor materials and devices is a powerful means to characterize some of their basic properties. In a first section, the fundamental noise sources and the more appropriate measurement techniques are given. In a second section, the usefulness of the noise measurements in materials is illustrated by many examples such as thermometry, diffusion coefficient measurements, deep traps characterization....ln the last section, basic noise properties of semiconductor devices are investigated and the consequences on device characterization by noise are outlined.