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Semiconductor materials and devices characterization by noise measurements : J. Graffeuil and G. Blasquez. Acta Electron.25 (3), 261 (1983). In French

Publisher: Elsevier Science
Year: 1984
Tongue: English
Weight: 139 KB
Volume: 24
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(84)90358-5

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