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Semiconductor Device Reliability || Modelling the Effects of Degradation on the Spectral Stability of Distributed Feedback Lasers

โœ Scribed by Christou, A.; Unger, B. A.

Book ID
121483255
Publisher
Springer Netherlands
Year
1990
Weight
605 KB
Category
Article
ISBN
9400924828

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over, the method has only small memory requiremmts. Figure 4 represents the input admittance versus frequency of a stub circuit. Figure 5 ( a = 20 mm, w , = w2 = 10 mm, b = 40 mm, sx = 5 mm, I , = 28.1 mm, d = 40 mm, dl = 10 mm, F, = 10) given by WCIP is in very good agreement with [8].