✦ LIBER ✦

Semiconductor Device Reliability || Considerations on the Degradation of DFB Lasers

✍ Scribed by Christou, A.; Unger, B. A.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Semiconductor Device Reliability || Mode

✍ Christou, A.; Unger, B. A. 📂 Article 📅 1990 🏛 Springer Netherlands ⚖ 605 KB

Effects of radiation loss on the perform

✍ Makino, T.; Glinski, J. 📂 Article 📅 1988 🏛 IEEE 🌐 English ⚖ 796 KB

The influence of external frequency shif

✍ Benoist, K.W. 📂 Article 📅 1996 🏛 IEEE 🌐 English ⚖ 318 KB

Effects of structural parameters on the

✍ Alam, M.F.; Karim, M.A.; Islam, S. 📂 Article 📅 1997 🏛 IEEE 🌐 English ⚖ 313 KB

Long-Term Stability of Mold Compounds an

✍ Joachim Mahler, Manfred Mengel 📂 Article 📅 2012 🏛 Springer US 🌐 English ⚖ 411 KB

Numerical Study of a DFB Semiconductor L

✍ Yitang Dai; Jianping Yao 📂 Article 📅 2008 🏛 IEEE 🌐 English ⚖ 940 KB