Semiconductor component reliability in an equipment operating in electromechanical telephone exchanges : F. H. Reynolds and J. W. Stevens. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 7

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 122 KB
• Volume: 18
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)90064-1