𝔖 Bobbio Scriptorium

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Accelerated reliability evaluation of trimetal integrated circuit chips in plastic packages : L. J. Gallace, H. J. Khajezadeh and A. S. Rose. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 224

Publisher: Elsevier Science
Year: 1978
Tongue: English
Weight: 132 KB
Volume: 18
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(78)90030-6

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