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Semiconducting properties of TiO2films thermally formed at 400° C

✍ Scribed by O. R. Cámara; C. P. Pauli; M. E. Vaschetto; B. Retamal; M. J. Aquirre; J. H. Zagal; S. R. Biaggio

Publisher
Springer
Year
1995
Tongue
English
Weight
460 KB
Volume
25
Category
Article
ISSN
0021-891X

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