Rekombinationszentren und damit eine Verminderung dter Elektronenkonzentration im Leitungsband. DaB tats~chlich eine solche Verminderung der Leitungselektronenkonzentration vorliegt und keine Abnahme der Bewegiichkeit den Effekt bedingt, wurde
Semiconducting half-Heusler and LiGaGe structure type compounds
✍ Scribed by Casper, Frederick ;Seshadri, Ram ;Felser, Claudia
- Publisher
- John Wiley and Sons
- Year
- 2009
- Tongue
- English
- Weight
- 580 KB
- Volume
- 206
- Category
- Article
- ISSN
- 0031-8965
No coin nor oath required. For personal study only.
✦ Synopsis
Abstract
Compounds with LiAlSi (half‐Heusler) and LiGaGe structure types have been investigated by means of band structure calculations. The LiAlSi structure type is known as the half‐Heusler structure type, whereas LiGaGe is a closely related hexagonal variant. A remarkable feature of some XYZ half‐Heusler compounds with 8 and 18 valence electrons is, that despite being composed of only metallic elements, they are semiconductors. More than 100 semiconducting compounds within these structure types are known. LiGaGe compounds have an additional degree of freedom, namely the degree of puckering of the layers. These compounds can become semiconducting at a certain degree of puckering. Half‐metallic behavior is rarely found in this structure type. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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## Abstract An enhancement in the dimensionless thermoelectric figure‐of‐merit (__ZT__) of an n‐type half‐Heusler material is reported using a nanocomposite approach. A peak __ZT__ value of 1.0 was achieved at 600 °C–700 °C, which is about 25% higher than the previously reported highest value. The