Semiclassical and wave mechanical modeling of charge control and direct tunneling leakage in MOS and H-MOS devices with ultra-thin oxides

✍ Scribed by Cassan, E.; Dollfus, P.; Galdin, S.; Hesto, P.

• Book ID: 114538626
• Publisher: IEEE
• Year: 2001
• Tongue: English
• Weight: 153 KB
• Volume: 48
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.915702