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Self-organized amorphous material in silicon (0 0 1) by focused ion beam (FIB) system

✍ Scribed by Y. Huang; D.J.H. Cockayne; C. Marsh; J.M. Titchmarsh; A.K. Petford-Long


Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
227 KB
Volume
252
Category
Article
ISSN
0169-4332

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