Classical MD simulations have been applied to study the Frenkel pair accumulation in electron-and ion-irradiated SiC for a wide temperature range 20-1200 K using different dose rates, so that ion flux affects significantly the resulting damage levels. Since the range of experimental dose rates is no
Self-interstitials and Frenkel pairs in electron-irradiated germanium
✍ Scribed by A. Carvalho; R. Jones; J. Goss; C. Janke; J. Coutinho; S. Öberg; P.R. Briddon
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 142 KB
- Volume
- 401-402
- Category
- Article
- ISSN
- 0921-4526
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✦ Synopsis
First principles calculations were used to study the structures and electrical levels of the self-interstitial in Ge. We considered the possibility of structural changes consequent with change in charge state and show these have important implications in the mobility and electrical activity of the defect. The theoretical model is compared to the results of low temperature electron irradiation in germanium reported in the literature.
📜 SIMILAR VOLUMES
Low intensity light ions (H + or He ++ ) irradiation of silicon introduced EPR Si-AA12 defect. Si-AA12 reveals close correlations with DLTS E1 ¼ E c À0.39 eV minority trap. Impurity interstitials or selfinterstitial associated secondary defects, such as interstitial carbon (C i ) or aluminum (Al i )