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Self-heating effects in SOI MOSFETs and their measurement by small signal conductance techniques

โœ Scribed by Tenbroek, B.M.; Lee, M.S.L.; Redman-White, W.; Bunyan, J.T.; Uren, M.J.


Book ID
114536651
Publisher
IEEE
Year
1996
Tongue
English
Weight
1016 KB
Volume
43
Category
Article
ISSN
0018-9383

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