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Self-correcting belt scales with digital control

✍ Scribed by V. S. Ivanov; A. I. Chernyaev

Book ID
104982600
Publisher
Springer US
Year
1990
Tongue
English
Weight
209 KB
Volume
33
Category
Article
ISSN
0543-1972

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## Abstract A new methodology for yield optimization of integrated circuits is presented. We propose a dc external control scheme which performs on‐line estimation of the active device model parameters and proper correction of the bias point. Design of a 2.5 Gbit/s front‐end amplifier has been perf