Bias correction and yield optimization of MMICs with external digital control

✍ Scribed by Giuseppe Scotti; Pasquale Tommasino; Alessandro Trifiletti

• Book ID: 102519757
• Publisher: John Wiley and Sons
• Year: 2001
• Tongue: English
• Weight: 137 KB
• Volume: 31
• Category: Article
• ISSN: 0895-2477
• DOI: 10.1002/mop.1379

✦ Synopsis

Abstract

A new methodology for yield optimization of integrated circuits is presented. We propose a dc external control scheme which performs on‐line estimation of the active device model parameters and proper correction of the bias point. Design of a 2.5 Gbit/s front‐end amplifier has been performed, and a strong yield improvement has been found. © 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 31: 134–137, 2001.