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Self-consistent field near the critical point

โœ Scribed by V. Krivnov; O. Olkhov; B. Provotorov; A. Rez


Publisher
Elsevier Science
Year
1969
Tongue
English
Weight
198 KB
Volume
29
Category
Article
ISSN
0375-9601

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The method of calculation of near-field images and near-field luminescence images of semiconductor surface with exciton cloud and nanostructure is proposed. The method is based on Green function technique in the frame of concept of local-filed. The main characteristic of the proposed approach is max