The method of calculation of near-field images and near-field luminescence images of semiconductor surface with exciton cloud and nanostructure is proposed. The method is based on Green function technique in the frame of concept of local-filed. The main characteristic of the proposed approach is max
Regularization in the macroscopic self-consistent model for near-field microscopy
โ Scribed by Elena A. Bozhevolnaya; Sergey I. Bozhevolnyi; Svend Berntsen
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 518 KB
- Volume
- 61
- Category
- Article
- ISSN
- 0304-3991
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