𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Section 14. X-ray material analysis


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
119 KB
Volume
559
Category
Article
ISSN
0168-9002

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X-ray microΓ‘uorescence provides the analytical scientist with a powerful tool to solve a variety of materials-based problems. Spatially resolved non-destructive elemental analyses can rapidly address a number of problems using qualitative analysis. Point spectra, line proÐles and elemental maps o †e