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Secondary radiation in the x-ray fluorescence analysis of samples with arbitrary composition

✍ Scribed by A. I. Lavrinenko; M. I. Faingol'd

Publisher
Springer US
Year
1991
Tongue
English
Weight
465 KB
Volume
55
Category
Article
ISSN
0021-9037

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X-ray fluorescence (XRF) has been widely used for the elemental analysis in the field of quality control of processes and research since it has the capability of performing non-destructive analysis and requires easy-to-prepare samples. In general, quantitative analysis is carried out by the calibrat