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Secondary ion mass spectrometry of molecular solids: a source of cluster ions

✍ Scribed by Orth, Robert G.; Jonkman, Harry T.; Michl, Josef


Book ID
126149356
Publisher
American Chemical Society
Year
1981
Tongue
English
Weight
272 KB
Volume
103
Category
Article
ISSN
0002-7863

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## Abstract Time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) using liquid metal ion guns (LMIGs) is now sensitive enough to produce molecular‐ion images directly from biological tissue samples. Primary cluster ions strike a spot on the sample to produce a mass spectrum. An image of this sa