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Secondary ion emission of selected transition metals under nitrogen oxides

✍ Scribed by Brudny, Margarete M. ;Rybczynski, Wolfgang ;Seidel, Wolfhart ;Thiel, Dieter


Publisher
Springer-Verlag
Year
1990
Weight
477 KB
Volume
102
Category
Article
ISSN
0344-838X

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A series of ionic and neutral Group VIII transition metal complexes with molecular masses up to 2500 u were analysed by time-of-flight secondary ion mass spectrometry (SIMS) and plasma desorption mass spectrometry (PDMS). The secondary ion emission, the secondary ion yields and the yield ratios Y(PD