This paper deals with a comparative investigation of tantalum and niobium solid electrolytic capacitors. Nb is an attractive replacement for Ta in solid electrolytic capacitors because it is lighter and cheaper than Ta. Although these two metals have much in common in their crystalline structure and
โฆ LIBER โฆ
Scintillation Breakdowns and Reliability of Solid Tantalum Capacitors
โ Scribed by Teverovsky, A.
- Book ID
- 118120852
- Publisher
- IEEE
- Year
- 2009
- Tongue
- English
- Weight
- 854 KB
- Volume
- 9
- Category
- Article
- ISSN
- 1530-4388
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
Reliability comparison of tantalum and n
โ
Y. Pozdeev
๐
Article
๐
1998
๐
John Wiley and Sons
๐
English
โ 121 KB
Polarization and fluctuation characteris
โ
T. Zednicek; J. Sikula; P. Hruska; B. Koktavy; P. Vasina; P. Koktavy; S. Hashigu
๐
Article
๐
1998
๐
John Wiley and Sons
๐
English
โ 131 KB
A new method of tantalum capacitor testing and reliability prediction is presented based on the analysis of polarization mechanisms and noise characteristics. Polarization mechanisms of the Ta 2 O 5 dielectric layer include electron polarization, fast ion polarization and ion relaxation polarization
High Temperature Properties of Solid Tan
โ
Thompson, D.; Gunnala, S.
๐
Article
๐
1977
๐
IEEE
๐
English
โ 760 KB
Statistical Approach to Reliability Impr
โ
Demos, Nicholas P.
๐
Article
๐
1960
๐
Institute of Electrical and Electronics Engineers
๐
English
โ 889 KB
Characteristics and production of tantal
โ
Jae Sik Yoon; Byung Il Kim
๐
Article
๐
2007
๐
Elsevier Science
๐
English
โ 616 KB
Impact of circuit resistance on the brea
โ
Erik K. Reed; Jonathan L. Paulsen
๐
Article
๐
2002
๐
Elsevier Science
๐
English
โ 357 KB