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Polarization and fluctuation characteristics of tantalum solid electrolyte capacitors

โœ Scribed by T. Zednicek; J. Sikula; P. Hruska; B. Koktavy; P. Vasina; P. Koktavy; S. Hashigushi

Publisher
John Wiley and Sons
Year
1998
Tongue
English
Weight
131 KB
Volume
14
Category
Article
ISSN
0748-8017

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โœฆ Synopsis

A new method of tantalum capacitor testing and reliability prediction is presented based on the analysis of polarization mechanisms and noise characteristics. Polarization mechanisms of the Ta 2 O 5 dielectric layer include electron polarization, fast ion polarization and ion relaxation polarization. Impurities usually add a fourth polarization type, migration polarization, which is effective in the mHz-kHz frequency region.

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