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Schottky diodes fabricated on cracked GaN epitaxial layer grown on (111) silicon

✍ Scribed by Sung-Jong Park; Heon-Bok Lee; Wang Lian Shan; Soo-Jin Chua; Jung-Hee Lee; Sung-Ho Hahm


Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
199 KB
Volume
2
Category
Article
ISSN
1862-6351

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Infrared reflectance analysis of GaN epi
✍ Z.C. Feng; T.R. Yang; Y.T. Hou πŸ“‚ Article πŸ“… 2001 πŸ› Elsevier Science 🌐 English βš– 282 KB

Infrared reflectance (IR) of GaN grown on sapphire and silicon substrates has been studied both theoretically and experimentally. The theoretical calculation of the IR spectra is based on the transfer matrix method. The IR spectral characteristics influenced by several factors, such as film thicknes