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Schottky barriers on layered semiconductors: a comparison between van der Waals and non van der Waals faces

✍ Scribed by A. Klein; J. Lehmann; C. Pettenkofer; W. Jaegermann; M. Lux-Steiner; E. Bucher


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
354 KB
Volume
70-71
Category
Article
ISSN
0169-4332

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Van der Waals forces between fused silic
✍ G.C.J. Rouweler πŸ“‚ Article πŸ“… 1971 πŸ› Elsevier Science 🌐 English βš– 236 KB

Direct measurements of Van der W&s forces between a flat plate and a pkneconvex Iens are reported for eeparatfans ranging from 40 to 28Onm. Both the lens and the flat plate were fueed silica. Bvo different lensee are used for the measurements. The f&et one with a radiue of curvature of 119.8 cm was