Scattering mechanisms affecting hole transport in remote-doped Si/SiGe heterostructures

✍ Scribed by Emeleus, C. J.; Whall, T. E.; Smith, D. W.; Kubiak, R. A.; Parker, E. H. C.; Kearney, M. J.

• Book ID: 120816379
• Publisher: American Institute of Physics
• Year: 1993
• Tongue: English
• Weight: 845 KB
• Volume: 73
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.352895