Scanning tunneling microscopy studies du
β
Bert VoigtlΓ€nder
π
Article
π
1999
π
Elsevier Science
π
English
β 682 KB
A scanning tunneling microscope (STM), capable of imaging during semiconductor growth, is described. The method (MBSTM) opens the possibility to follow the growth process of semiconductor molecular beam epitaxy (MBE) during growth. The ability of the microscope to access the evolution of the growth