<P>Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from f
Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale 2 vol. set
โ Scribed by Sergei V. Kalinin
- Publisher
- Springer
- Year
- 2006
- Tongue
- English
- Leaves
- 1002
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
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<P>Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from f
<p><EM>Scanning Probe Microscopy</EM> brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques rangi