InTech, 2012. - 253 p. - This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization of physical properties of different materials at the nanoscale. The topics in the book range from surface morphology analysis of thin film
Scanning Probe Microscopy - Phys. Prop. Char. at Nanoscale
โ Scribed by V. Nalladega
- Publisher
- Intech
- Year
- 2012
- Tongue
- English
- Leaves
- 254
- Category
- Library
No coin nor oath required. For personal study only.
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