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Scanning near-field optical microscopy as a tool for the characterization of multimode interference devices

✍ Scribed by Martin, Matthieu J. ;Benyattou, Taha ;Orobtchouk, Régis ;Rooms, Frédéric ;Morand, Alain ;Schanen, Isabelle ;Benech, Pierre

No coin nor oath required. For personal study only.

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