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Scanning near-field optical microscope for the characterization of optical integrated waveguides

✍ Scribed by Borrise, X.; Jimenez, D.; Barniol, N.; Perez-Murano, F.; Aymerich, X.

Book ID: 115369861
Publisher: Optical Society of America
Year: 2000
Tongue: English
Weight: 443 KB
Volume: 18
Category: Article
ISSN: 0733-8724
DOI: 10.1109/50.827509

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