𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Sensitivity analysis of scanning near-field optical microscope probe

✍ Scribed by Te-Hua Fang; Win-Jin Chang


Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
271 KB
Volume
35
Category
Article
ISSN
0030-3992

No coin nor oath required. For personal study only.

✦ Synopsis


In this paper, we study the dynamic modes of a scanning near-ΓΏeld optical microscope (SNOM) which uses an optical ΓΏber probe; and the sensitivity of exural and axial vibration modes for the probe were derived and the closed-form expressions were obtained. According to the analysis, as expected each mode has a di erent sensitivity and the ΓΏrst mode is the most sensitive mode of exural and axial vibration for the SNOM probe. The sensitivities of both exural and axial modes are greater for a material surface that is compliant with the cantilever probe. As the contact sti ness increases, the high-order vibration modes are more sensitive than the lower-order modes. Furthermore, the axial contact sti ness has a signiΓΏcant e ect on the sensitivity of the SNOM probe, and this should be noted when designing new cantilever probes.


πŸ“œ SIMILAR VOLUMES


A metamaterial-scanning near-field optic
✍ H. Cory; Y. Hao; C. G. Parini πŸ“‚ Article πŸ“… 2006 πŸ› John Wiley and Sons 🌐 English βš– 231 KB

like a PMC surface for this direction of observation. It can also be noted that the fields are zero for Ο­ /2, except when Ο­ 0 and Ο­ . Thus, the field will propagate along the surface in the direction of the strips, that is, in the direction for which the surface behaves like a hard surface. This cor

High resolution and high sensitivity nea
✍ J.M. Freyland; R. Eckert; H. Heinzelmann πŸ“‚ Article πŸ“… 2000 πŸ› Elsevier Science 🌐 English βš– 662 KB

We have built a multi-purpose optical microscope by integrating a conventional confocal laser microscope (CLM) and a state of the art scanning near-field optical microscope (SNOM) with a conventional inverted optical microscope. The setup is designed for fluorescence imaging of delicate samples at v