Scanning near-field cathodoluminescence microscopy on indented MgO crystal

✍ Scribed by Pastré, D.; Troyon, M.; Duvaut, T.; Beaudoin, J. L.

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 273 KB
• Volume: 27
• Category: Article
• ISSN: 0142-2421
• DOI: 10.1002/(sici)1096-9918(199905/06)27:5/6<495::aid-sia485>3.0.co;2-i

✦ Synopsis

The cathodoluminescence (CL) emission arising from the indentation of an MgO single crystal cleaved along (100) faces is investigated by scanning near-Ðeld cathodoluminescence microscopy (SNCLM). This technique is performed with a hybrid instrument that is a combination of a scanning force microscope, a scanning near-Ðeld optical microscope and a scanning electron microscope. The interest of this instrument is to allow one to obtain near-Ðeld CL images, the resolution of which (¿100 nm) is at least an order of magnitude better than the resolution obtained with a classical CL imaging system (¿1 lm) using a conventional scanning electron microscope. On the indented MgO, the CL emission appears mainly localized in the deformed regions, especially in the slip bands created just around the indentation. These slip bands are revealed only because of the high resolution of our hybrid system.