Scanning moiré and spatial-offset phase-stepping for surface inspection of structures

✍ Scribed by S. Yoneyama; Y. Morimoto; M. Fujigaki; Y. Ikeda

• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 653 KB
• Volume: 43
• Category: Article
• ISSN: 0143-8166
• DOI: 10.1016/j.optlaseng.2004.09.015

✦ Synopsis

In order to develop a high-speed and accurate surface inspection system of structures such as tunnels, a new surface profile measurement method using linear array sensors is studied. The sinusoidal grating is projected on a structure surface. Then, the deformed grating is scanned by linear array sensors that move together with the grating projector. The phase of the grating is analyzed by a spatial offset phase-stepping method to perform accurate measurement. The surface profile measurements of the wall with bricks and the concrete surface of a structure are demonstrated using the proposed method. The change of geometry or fabric of structures and the defects on structure surfaces can be detected by the proposed method. It is expected that the surface profile inspection system of tunnels measuring from a running train can be constructed based on the proposed method.