𝔖 Bobbio Scriptorium
✦   LIBER   ✦

An AFM scanning moiré technique for the inspection of surface deformations

✍ Scribed by Z.W. Zhong; Y.G. Lu

Publisher
Springer
Year
2004
Tongue
English
Weight
571 KB
Volume
23
Category
Article
ISSN
0268-3768

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Scanning moiré and spatial-offset phase-
Scanning moiré and spatial-offset phase-stepping for surface inspection of structures
✍ S. Yoneyama; Y. Morimoto; M. Fujigaki; Y. Ikeda 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 653 KB

In order to develop a high-speed and accurate surface inspection system of structures such as tunnels, a new surface profile measurement method using linear array sensors is studied. The sinusoidal grating is projected on a structure surface. Then, the deformed grating is scanned by linear array sen