Scanning Microscopy for Nanotechnology: Techniques and Applications

✍ Scribed by Weilie Zhou, Zhong Lin Wang

• Publisher: Springer
• Year: 2006
• Tongue: English
• Leaves: 534
• Edition: 1
• Category: Library

✦ Synopsis

Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.

✦ Table of Contents

front-matter.pdf......Page 1
000.pdf......Page 13
001 - 40.pdf......Page 14
041 - 75.pdf......Page 54
076 - 100.pdf......Page 89
101 - 119.pdf......Page 114
120 - 151.pdf......Page 133
152 - 191.pdf......Page 165
192 - 224.pdf......Page 205
225 - 236.pdf......Page 238
237 - 280.pdf......Page 250
281 - 305.pdf......Page 294
306 - 356.pdf......Page 319
357 - 383.pdf......Page 370
384 - 426.pdf......Page 397
427 - 466.pdf......Page 440
467 - 489.pdf......Page 480
490.pdf......Page 503
back-matter.pdf......Page 504