<P>Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. <EM>Scanning Microscopy for Nanotechnology</EM> addresses the rapid development of these techniques for
Advanced scanning microscopy for nanotechnology techniques and applications
β Scribed by Weilie Zhou
- Publisher
- New York, NY Springer
- Year
- 2007
- Tongue
- English
- Leaves
- 535
- Category
- Library
No coin nor oath required. For personal study only.
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<P>Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. <EM>Scanning Microscopy for Nanotechnology</EM> addresses the rapid development of these techniques for
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