Scanning low energy electron loss microscopy (SLEELM): metals on semiconductors : Vacuum 38, 209 (1988)

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 128 KB
• Volume: 29
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(89)90293-x