Scanning low energy electron loss microscopy (SLEELM): metals on semiconductors: M M El Gomati and J A D Matthew, Vacuum, 38, 1988, 209–211

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 305 KB
• Volume: 39
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(89)90617-9