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Scanning Hall probe measurements of field distributions of a coated conductor under applied fields

✍ Scribed by Yoo, Jaeun; Jung, Yonghwan; Lee, Jaeyoung; Lim, Sunme; Lee, SangMoo; Jung, YeHyun; Youm, Dojun; Kim, Hosup; Ha, HongSoo; Oh, Sangsoo

No coin nor oath required. For personal study only.

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