Nondestructive Measurement of Critical Current Distribution of SmBCO Coated Conductor Using Hall Probe

✍ Scribed by Ho-Sup Kim, ; Sang-Soo Oh, ; Nam-Jin Lee, ; Seung-Kyu Baik, ; Dong-Woo Ha, ; Rock-Kil Ko, ; Hong-Soo Ha, ; Tae-Hyung Kim, ; Do-Jun Youm, ; Seung-Hyun Moon, ; Chan Park,

• Book ID: 121833848
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 239 KB
• Volume: 20
• Category: Article
• ISSN: 1051-8223
• DOI: 10.1109/TASC.2009.2039205