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Scanning electron microscopy studies on switching lateral transistors in integrated circuits

✍ Scribed by J.D. Last; D.W. Lucas

Publisher: Elsevier Science
Year: 1971
Tongue: English
Weight: 724 KB
Volume: 14
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(71)90058-x

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