Post-characterization of GaAs field effect transistors and integrated circuits on test patterns : M. Rocchi. Acta Electron.23 (1) 63 (1980) (in French)

• Publisher: Elsevier Science
• Year: 1981
• Tongue: English
• Weight: 131 KB
• Volume: 21
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(81)90137-2