๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Scanning electron microscope studies of weathered rocks: A review of nomenclature and methods

โœ Scribed by F. J. Baynes; W. R. Dearman


Book ID
110606202
Publisher
Springer
Year
1978
Tongue
English
Weight
738 KB
Volume
18
Category
Article
ISSN
1435-9529

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Methods of onion seed preparation for sc
โœ Mohamed-Yasseen, Yasseen ;Jakstys, Birute P. ;Splittstoesser, Walter E. ๐Ÿ“‚ Article ๐Ÿ“… 1991 ๐Ÿ› Wiley (John Wiley & Sons) ๐ŸŒ English โš– 244 KB

Scanning electron microscopy (SEM) has been used to study seed structure . Seeds with shrunken, cracked, or ruptured seed coats are usually short-lived . Seed shrinkage is an indication of a weak seed coat, resulting in cracks and damage which ultimately leads to loss of seed vigor or even death (Ab