Scanning-DLTS investigation of point defect inhomogeneities in semiconducting materials

✍ Scribed by O. Breitenstein; Ch. Eisenschmidt

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 523 KB
• Volume: 12
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/0167-9317(90)90030-w