𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Scanning Auger microscopy of corroded SiC

✍ Scribed by R. Browning; J. Smialek; N. Jacobson


Publisher
Springer
Year
1986
Tongue
English
Weight
643 KB
Volume
5
Category
Article
ISSN
0261-8028

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Reflected Electron Energy-loss Microscop
✍ Paparazzo, E. πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 495 KB πŸ‘ 2 views

The diagnostic potential of reΓ‘ected electron energy-loss microscopy (REELM) and scanning Auger microscopy (SAM) are explored with respect to two particular aspects encountered in the surface microchemical analysis of semiconductor materials : determining the kind of coverage, i.e. whether continuou